Introduction
BS-6030 Inverted Metallurgical Microscope can identify and analyze not only a variety of metals, alloys, non-metallic material and the organizational structure and integrated circuits, but also micro-particles, wires, fibers, surface coating and so on. Digital cameras can be added to the trinocular tube to take images and make image analysis. DIC observation is optional.
Specification
Model | | BS-6030 |
Optical System | Infinite optical system | ● |
Viewing Head | Siedentopf trinocular head, inclined at 30°, interpupillary distance 48-75mm | ● |
Extra Wide Field Eyepiece | EW10×/ 22 | ● |
EW10×/ 20 Eyepiece with scale of cross hair | ● |
EW15×/ 16 | ○ |
EW20×/ 12 | ○ |
Infinite LWD Plan Achromatic Objective | 5×/0.12/∞/0 (BF/DF) LWD 10.0mm | ● |
10×/0.25/∞/0 (BF/DF) LWD 10.0mm | ● |
20×/0.40/∞/0 (BF/DF) LWD 5.0mm | ● |
50×/0.75/∞/0 (BF/DF) LWD 1.3mm | ● |
100×/0.90/∞/0 (BF/DF) LWD 0.7mm | ● |
Nosepiece | Backward quintuple nosepiece | ● |
Stage | Double layer mechanical stage 226×178mm, Moving range 40mm×40mm | ● |
Small stage plate, Φ20mm, Φ30mm, | ● |
Focusing | Coaxial coarse & fine adjustment, fine division 2μm, move up 1mm, down 7mm | ● |
Kohler Reflected Illumination | 12V/50W Halogen lamp, center and brightness adjustable | ● |
Polarizer and analyzer | ● |
DIC | ○ |
Built-in Green, Blue, Yellow, Gray and Frosted filters | ● |
Optional Accessories | Photo attachment | ○ |
Video attachment with C mount | ○ |
Micrometer scale 0.01mm | ● |
Note: ●Standard parts ○Optional parts
Application
BS-6030 can be used in institutes and laboratories to observe and identify the structure of various metal and alloy, it also can be widely used in electronics, chemical and instrumentation industry, observe the opaque material and transparent material, such as metal, ceramics, integrated circuits, electronic chips, printed circuit boards, LCD panels, film, powder, toner, wire, fibers, plated coatings, and other non-metallic materials and so on.
Features
1. Infinite optical system provides excellent optical functions.
2. DIC observation is optional.
3. Meet most of your requirements by high performance optical system, technological innovation and high stability.