Awarded the R&D 100 2007 Award
Nanophotonics Meteorology Platform
Nanonics carries nanophotonics characterization to new heights with The Optometronic 4000TM. Photonics and plasmonics nano characterization today demands the ability to integrate multiple functions transparently and with modularity on one platform. The Optometronic 4000TM combines Nanonics' revolutionary Multiprobe near-field optical NSOM SNOM and atomic force capabilities with Nanonics' state of the art lensed fibers and highly compact lensed fiber NanoManipulators, branding the Optometronic 4000TM with the mark of excellence and innovation that is Nanonics. Optometronic 4000TM is an ideal nano photonics meteorology platform for nanocharactarization and manipulation for variety of nano photonics NSOM SNOM applications such as lasers, photonics waveguides, solar cells, hybrid photonics and plasmonics devices, etc.
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Key Features
Design
Applications
Online Integrations
Specifications
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Enter a new multiprobe world of combined far-field and near-field optical characterization.
The Optometronic 4000TM offers integrated optical and structural characterization of photonics and nanophotonics components and devices for state-of-the-art silicon nanophotonics, photonics waveguides, plasmonics, photonics band gap materials and metamaterials. The Optometronic 4000TM features a variety of forefront directions in passive and active photonics devices and materials.
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Optometronic 4000TM One Probe, two Nanoaligners
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Optometronic 4000TM Two Probes, two Nanoaligners - top view
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A COMPLEX OF INNOVATIONS
- Modular and Upgradable
- A unique platform with integrated NanoAlignment and NanoOptical characterization
- On-line Multiple SPM Near-Field Optical (NSOM) & Apertureless Near-Field Optical (ANSOM or sSNOM) Probes and Nanoaligners
- Multiple SPM and near-field optical probes for apertured NSOM and apertureless (ANSOM or sSNOM) on-line
- Mix and match nanoprobes with nanoaligners
- Transparent Optical Integration
- Upright microscopes
- Inverted microscopes
- Dual 4pi configurations (illumination from above and below)
- Side illumination with nanoaligned lensed fibers
- All near-field modes: transmission/reflection/collection/ illumination
- A Complex of Online Optical Measurements
- True near-field /far-field M2
- On-line all near-field modes of NSOM, ANSOM and sSNOM operation with multiple probes
- Bridge near-field and far-field characterizations with ease
- A Complex of Measurements Protocols
- Picoamp electrical measurements
- Ultrasensitive thermal measurements
- Reconfigurable electrical, thermal and optical interconnects with SPM or nanoaligner control
- Full structural/thermal/electrical and optical correlation with online SPM and near-field/far-field optics
- Ultra Stable Platform: Full Isolation from Online Noise Sources
- From Femtosecond lasers
- From visible and Infra Red spectrometers, CCD and InGaAs
- NanoToolKitTM of Multifunctional Probes & Lensed Fibers
- Highly exposed tip glass cantilevered AFM and NSOM apertureless and scattering probes
- Multi-functional SPM probes for thermal, electrical and chemical nanodelivery
- All probes are optically and multiprobe friendly
- Highly compact lensed fiber illumination and collection
- Tuning Fork Feedback
- Ultra sensitive feedback with high Q-factors
- Improved imaging quality
- No interference due to optical feedback
- Unprecedented 130 µm Piezo Z Range
- Tip or Sample Scanning & Manipulation
- MultiProbe NanoManipulation
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